发明名称 CLEANING COMPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a cleaning composition capable of sufficiently removing a plasma etching residue on a semiconductor substrate without damaging a wiring structure and an interlaminar insulation structure, and to provide a process for producing a semiconductor device using the cleaning composition.SOLUTION: The cleaning composition for removing a plasma etching residue formed on a semiconductor substrate contains (component a) 57-95 wt.% of water; (component b) 1-40 wt.% of polyhydroxy compound having secondary and/or tertiary hydroxyl groups; (component c) organic acid; and (component d) a quaternary ammonium compound, and its pH is 5-10. The method for manufacturing a semiconductor device includes a step for cleaning the plasma etching residue formed on the semiconductor substrate by the cleaning composition.
申请公布号 JP2011204909(A) 申请公布日期 2011.10.13
申请号 JP20100070821 申请日期 2010.03.25
申请人 FUJIFILM CORP 发明人 MIZUTANI ATSUSHI;FUSHIMI HIDEO;TAKAHASHI TOMOI;TAKAHASHI KAZUYOSHI
分类号 H01L21/304;C11D7/08;C11D7/16;C11D7/26;C11D7/32;H01L21/306;H01L21/3213;H01L21/768;H01L23/522 主分类号 H01L21/304
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