发明名称 WAVEFORM MEASUREMENT APPARATUS AND SEMICONDUCTOR TESTER
摘要 PROBLEM TO BE SOLVED: To display a waveform inputted from a measurement target object on a display apparatus in a short period of time.SOLUTION: A waveform measurement apparatus 1 is equipped with: the display apparatus 6 for displaying the waveform inputted from the measurement target object; an AD conversion circuit 13 for converting the input waveform from an analog data into a digital data as a floating point data; a display data generation circuit 14 for inputting the floating point data, converting the input floating point data into a display data for displaying the waveform on the display apparatus 6 with regard to a data form, and generating the display data; and a memory 4 for storing the display data generated by the display data generation circuit 14 so as to display it on the display apparatus 6. Since the display apparatus 6 previously converts the displayable display data before it is stored in the memory 4 and stores it in the memory 4, the display data read from the memory 4 is immediately displayed on the display apparatus 6.
申请公布号 JP2011203070(A) 申请公布日期 2011.10.13
申请号 JP20100069903 申请日期 2010.03.25
申请人 YOKOGAWA ELECTRIC CORP 发明人 OKADA MASANORI
分类号 G01R13/20 主分类号 G01R13/20
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