发明名称 HETERODYNE INTERFEROMETRY DISPLACEMENT MEASUREMENT APPARATUS
摘要 A heterodyne interferometry displacement measurement apparatus includes a first optical system including a light source (LASER) and a diffraction grating (GT0) that generates two diffracted lights to combine the two diffracted lights to generate a combined light and that causes the two diffracted lights to interfere with each other to generate a first frequency difference signal, a second optical system that converts the combined light into two lights of which frequencies are different from each other by a second frequency difference in accordance with a displacement of an object and that causes the two lights to interfere with each other to generate a second frequency difference signal, and an output device that outputs information of a displacement amount of the object based on the first frequency difference signal and the second frequency difference signal.
申请公布号 US2011249270(A1) 申请公布日期 2011.10.13
申请号 US201113079390 申请日期 2011.04.04
申请人 CANON KABUSHIKI KAISHA 发明人 ISHIZUKA KO
分类号 G01B9/02 主分类号 G01B9/02
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