发明名称 |
APPARATUS AND TECHNIQUES OF NON-INVASIVE ANALYSIS |
摘要 |
Apparatus and methods, which comprise examination of an abnormality on a subject using a temperature stimulus applied to the subject, provide a non-invasive analysis technique. In an embodiment, a non-invasive infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for evaluating the abnormality. A technique including applying temperature stimuli and detecting responses to the applied temperature stimuli provide a non-invasive technique that can be used to identify an abnormality on a subject and/or characteristics of the abnormality. In an embodiment, a non-invasive transient infrared imaging technique can be used to observe the temporal response of a lesion to temperature stimuli to form a basis for determining characteristics correlated to the lesion. Additional apparatus, systems, and methods are disclosed. |
申请公布号 |
WO2011127247(A2) |
申请公布日期 |
2011.10.13 |
申请号 |
WO2011US31529 |
申请日期 |
2011.04.07 |
申请人 |
KRISHNA, SANJAY;KRISHNA, SANCHITA |
发明人 |
KRISHNA, SANJAY;KRISHNA, SANCHITA |
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