发明名称 RESISTANCE CHANGE ELEMENT, MEMORY CELL ARRAY, AND RESISTANCE CHANGE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a resistance change element capable of binarization or multivalued configuration and of controlling a change in resistance with precision, a memory cell array, and a resistance change device.SOLUTION: The resistance change element is characterized by comprising a first electrode 2, a second electrode 3, and an oxide layer 1 provided between the first electrode 2 and the second electrode 3, wherein the first electrode 2 includes metal, the oxide layer 1 is amorphous and includes Si and O, the concentration of O increases from the first electrode 2 toward the second electrode 3, and there exists at least one region having a local maximum of the concentration gradient of O in the direction of the lamination of the oxide layer 1.
申请公布号 JP2011205045(A) 申请公布日期 2011.10.13
申请号 JP20100073697 申请日期 2010.03.26
申请人 TOSHIBA CORP 发明人 FUJII AKISUKE;MITANI YUICHIRO;MATSUSHITA DAISUKE
分类号 H01L49/00;H01L27/10;H01L45/00 主分类号 H01L49/00
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