| 摘要 |
PROBLEM TO BE SOLVED: To confirm operation of a circuit part to be inspected at desired timing in a semiconductor device including a circuit for inspection.SOLUTION: The semiconductor device includes a circuit part to be inspected and an inspection circuit part. The inspection circuit part includes a signal input part, a comparison part, and a control circuit part. The control circuit part is connected to the signal input part, the comparison part, and the circuit part to be inspected. The signal input part obtains an inspection signal or an inspection expectation value, and transmits the inspection signal to the control circuit part. The control circuit part transmits the inspection signal to the circuit part to be inspected, obtains an operation signal output by the circuit part to be inspected on the basis of the inspection signal, and transmits it to the comparison part. The comparison part outputs a comparison result obtained by comparing the inspection expectation value with the operation signal on the basis of a synchronization signal. |
