| 摘要 |
The method for inspecting the width of a coated film in accordance with the present invention is a method for detecting a width W1 of a coated film 20 that is formed on an elongated sheet-like substrate 10 along the longitudinal direction, the width W1 being detected in a transverse direction intersecting this longitudinal direction, the method including: a step of measuring a thickness profile in the transverse direction of the coated film 20; a step of creating approximating curves L1, L2 of a function of a distance X and a thickness Y in end-proximal regions 24a, 24b of both ends of the coated film 20 in the transverse direction, on the basis of the measured thickness profile; and a step of taking, as the both ends in the transverse direction, a distance Xe1 corresponding to a thickness threshold Yt determined from the approximating curve L1 of one end-proximal region 24a and a distance Xe2 corresponding to a thickness threshold Yt determined from the approximating curve L2 of the other end-proximal region 24b on the basis of the obtained approximating curves L1, L2 and a thickness threshold Yt from the reference point Y0 that has been set in advance, and of calculating an absolute value of a difference between Xe1 and Xe2, that is Xe1−Xe2, as the width W1 of the coated film 20 in the transverse direction at the predetermined measurement point.
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