发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device that can control a substrate voltage of an MOSFET without causing a drain current to depend upon a temperature or a process variation.SOLUTION: The semiconductor integrated circuit device includes: an integrated circuit body 16B having multiple N-type MOSFETs on a semiconductor substrate; a monitor unit 15B that monitors a drain current of one of the N-type MOSFETs; and a substrate voltage adjusting unit 14B that controls a substrate voltage of the semiconductor substrate so as to keep the drain current constant. The monitor unit includes a current source 12B and a monitor N-type MOSFET 11B. The substrate voltage adjusting unit compares the drain potential of the monitor N-type MOSFET and reference potential and feeds back an output voltage based on the comparison result to the substrate voltage of the monitor N-type MOSFET. The monitor unit includes an N-type MOSFET for leak current cancellation which adds a source-drain current to the drain of the monitor N-type MOSFET when a gate and a source of the N-type MOSFET for leak current cancellation have substantially equal potential. |
申请公布号 |
JP2011205104(A) |
申请公布日期 |
2011.10.13 |
申请号 |
JP20110092245 |
申请日期 |
2011.04.18 |
申请人 |
PANASONIC CORP |
发明人 |
SUMIDA MASAYA;SAKIYAMA SHIRO;KINOSHITA MASAYOSHI |
分类号 |
H01L21/822;H01L27/04;H01L27/092;H01L29/78;H03K5/08 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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