发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
Disclosed is a semiconductor device which comprises: an interlayer insulating film; a wiring line that is formed on the interlayer insulating film so as to protrude therefrom and is composed of a material that contains copper as a main component; and a passivation film that is formed so as to cover the wiring line. The passivation film is composed of a laminated film wherein a first nitride film, an intermediate film and a second nitride film are laminated in this order from the wiring line side. The intermediate film is formed of an insulating material (for example, an oxide) that is different from those of the first and second nitride films. |
申请公布号 |
WO2011125928(A1) |
申请公布日期 |
2011.10.13 |
申请号 |
WO2011JP58400 |
申请日期 |
2011.04.01 |
申请人 |
ROHM CO., LTD.;NAKAO, YUICHI;OHTA, TADAO |
发明人 |
NAKAO, YUICHI;OHTA, TADAO |
分类号 |
H01L21/768;H01L21/3205;H01L23/52;H01L23/522 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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