发明名称 POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad with excellent flattening characteristics and capable of restraining generation of scratches, and to provide a method of manufacturing a semiconductor device using the polishing pad.SOLUTION: In the polishing pad including a polishing layer having elliptical gas bubbles 12, the long axis of the elliptical gas bubbles is inclined at 5-45 degrees to the thickness direction of the polishing layer.
申请公布号 JP2011200946(A) 申请公布日期 2011.10.13
申请号 JP20100068225 申请日期 2010.03.24
申请人 TOYO TIRE & RUBBER CO LTD 发明人 KAZUNO ATSUSHI
分类号 B24B37/24;H01L21/304 主分类号 B24B37/24
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