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发明名称
auto probe inspection appratus and the inspecting method for LCD panel
摘要
<p>또한, 본 발명은 불량 유출을 감소시켜 제조 수율을 향상시키고, 액정 셀 최종 검사시에 검사자 수를 감소시킬 수 있어 인적 자원을 효율적으로 사용할 수 있다.</p>
申请公布号
KR101073330(B1)
申请公布日期
2011.10.12
申请号
KR20040087276
申请日期
2004.10.29
申请人
发明人
分类号
G02F1/13
主分类号
G02F1/13
代理机构
代理人
主权项
地址
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