发明名称 |
PHOTOMASK BLANK AND FABRICATION METHOD THEREFOR, AND PHOTOMASK AND FABRICATION METHOD THEREFOR |
摘要 |
A photomask blank for use in the manufacture of a photomask adapted to be applied with exposure light having a wavelength of 200 nm or less has a thin film on a transparent substrate. The thin film is made of a material containing a transition metal, silicon, and carbon and comprising silicon carbide and/or a transition metal carbide. |
申请公布号 |
KR20110112477(A) |
申请公布日期 |
2011.10.12 |
申请号 |
KR20117021044 |
申请日期 |
2010.02.04 |
申请人 |
HOYA CORPORATION |
发明人 |
HASHIMOTO MASAHIRO;SUZUKI TOSHIYUKI;IWASHITA HIROYUKI |
分类号 |
C23C14/06;G03F1/50;G03F1/54 |
主分类号 |
C23C14/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|