发明名称 Reliable memory cell
摘要 A method of forming a semiconductor device is presented. A substrate prepared with a second gate is provided. The second gate is processed to form a second gate with a rounded corner and a first gate is formed on the substrate. The first gate is adjacent to and overlaps a portion of the second gate and the rounded corner.
申请公布号 US8034670(B2) 申请公布日期 2011.10.11
申请号 US20090401622 申请日期 2009.03.11
申请人 GLOBALFOUNDRIES SINGAPORE PTE. LTD. 发明人 PHUA TIMOTHY;INDAJANG BANGUN;SOHN DONG KYUN
分类号 H01L21/335;H01L29/76 主分类号 H01L21/335
代理机构 代理人
主权项
地址