发明名称 Semiconductor device including a plurality of memory cells with no difference in erasing properties
摘要 A semiconductor device includes a semiconductor substrate, a plurality of memory cells, a plurality of bit lines, and a plurality of source lines. The memory cells are located in the semiconductor substrate. Each of the memory cells includes a trench provided in the semiconductor substrate, an oxide layer disposed on a sidewall of the trench, a tunnel oxide layer disposed at a bottom portion of the trench, a floating gate disposed in the trench so as to be surrounded by the oxide layer and the tunnel oxide layer, and an erasing electrode disposed on an opposing side of the tunnel oxide layer from the floating gate. The bit lines and the source lines are alternately arranged on the memory cells in parallel with each other.
申请公布号 US8035154(B2) 申请公布日期 2011.10.11
申请号 US20080289799 申请日期 2008.11.04
申请人 DENSO CORPORATION 发明人 NARUSE TAKAYOSHI;KATADA MITSUTAKA;FUJII TETSUO
分类号 H01L29/788 主分类号 H01L29/788
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