发明名称 Semiconductor element
摘要 A semiconductor element includes a semiconductor layer having a first doping density, a metallization, and a contact area located between the semiconductor layer and the metallization. The contact area includes at least one first semiconductor area that has a second doping density higher than the first doping density, and at least one second semiconductor area in the semiconductor layer. The second semiconductor area is in contact with the metallization and provides lower ohmic resistance to the metallization than a direct contact between the semiconductor layer and the metallization provides or would provide.
申请公布号 US8035195(B2) 申请公布日期 2011.10.11
申请号 US20080126751 申请日期 2008.05.23
申请人 INFINEON TECHNOLOGIES AG 发明人 NIEDERNOSTHEIDE FRANZ JOSEF;PFAFFENLEHNER MANFRED;SCHULZE HANS-JOACHIM
分类号 H01L29/866 主分类号 H01L29/866
代理机构 代理人
主权项
地址
您可能感兴趣的专利