发明名称 Split-gate nonvolatile semiconductor memory device
摘要 A nonvolatile semiconductor memory device includes a floating gate; an erasing gat; and a control gate. The floating gate is provided on a channel region of a semiconductor substrate through a first insulating layer. The erasing gate is provided on the floating gate through a second insulating layer. The control gate is provided beside the floating gate and the erasing gate through a third insulating layer. The floating gate is U-shaped.
申请公布号 US8035155(B2) 申请公布日期 2011.10.11
申请号 US20090320965 申请日期 2009.02.10
申请人 RENESAS ELECTRONICS CORPORATION 发明人 SAKAI ISAMI
分类号 H01L29/788 主分类号 H01L29/788
代理机构 代理人
主权项
地址