发明名称 Method of forming a phase change material layer, method of forming a phase change memory device using the same, and a phase change memory device so formed
摘要 A method of forming a phase change material layer includes preparing a substrate having an insulator and a conductor, loading the substrate into a process housing, injecting a deposition gas into the process housing to selectively form a phase change material layer on an exposed surface of the conductor, and unloading the substrate from the process housing, wherein a lifetime of the deposition gas in the process housing is shorter than a time the deposition gas takes to react by thermal energy.
申请公布号 US8034683(B2) 申请公布日期 2011.10.11
申请号 US20070785807 申请日期 2007.04.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO SUNG-LAE;LEE CHOONG-MAN;LEE JIN-IL;LIM SANG-WOOK;PARK HYE-YOUNG;PARK YOUNG-LIM
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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