发明名称 |
Nitride semiconductor heterojunction field effect transistor having wide band gap barrier layer that includes high concentration impurity region |
摘要 |
The objective of the present invention is to provide a semiconductor device of a hetero-junction field effect transistor that is capable of obtaining a high output and a high breakdown voltage and a manufacturing method of the same. The present invention is a semiconductor device of a hetero-junction field effect transistor provided with an AlxGa1-xN channel layer with a composition ratio of Al being x (0<x<1) formed on a substrate, an AlyGa1-yN barrier layer with a composition of Al being y (0<y≦̸1) formed on the channel layer, and source/drain electrodes and a gate electrode formed on the barrier layer, wherein the composition ratio y is larger than the composition ratio x.
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申请公布号 |
US8035130(B2) |
申请公布日期 |
2011.10.11 |
申请号 |
US20080054714 |
申请日期 |
2008.03.25 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
NANJO TAKUMA;SUITA MUNEYOSHI;ABE YUJI;OISHI TOSHIYUKI;TOKUDA YASUNORI |
分类号 |
H01L29/778 |
主分类号 |
H01L29/778 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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