发明名称 Dummy Metal Design for Packaging Structures
摘要 An integrated circuit structure includes a semiconductor chip, a metal pad at a major surface of the semiconductor chip, and an under-bump metallurgy (UBM) over and contacting the metal pad. A metal bump is formed over and electrically connected to the UBM. A dummy pattern is formed at a same level, and formed of a same metallic material, as the metal pad.
申请公布号 US2011241202(A1) 申请公布日期 2011.10.06
申请号 US20100750468 申请日期 2010.03.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIU TZUAN-HORNG;HOU SHANG-YUN;JENG SHIN-PUU;WU WEI-CHENG;WEI HSIU-PING;CHEN CHIH-HUA;KUO CHEN-CHENG;CHEN CHEN-SHIEN;TSENG MING HUNG
分类号 H01L23/485 主分类号 H01L23/485
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