| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of certainly removing luminance nonuniformity due to geometric distortion of an image intensifier and/or a CCD camera, and thus capable of improving the quality of an X-ray image of an inspection object.SOLUTION: The X-ray inspection device includes: an image distortion correction means 13 for correcting X-ray transmission information from an X-ray detector 2 based on geometric distortion of the image intensifier 2a and/or the CCD camera 2b; and in addition, a luminance nonuniformity correction means 14 for correcting luminance nonuniformity of the X-ray transmission information similarly based on the geometric distortion of the image intensifier 2a and/or the CCD camera 2b. This structure enables improvement in quality of an X-ray image of an inspection object, and further enables achievement of improvement in inspection accuracy or measurement accuracy. |
