发明名称 LARGE CURRENT BREAKING METHOD BY FIELD EFFECT TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To solve the following problem associated with a current turn-on/off switch using a field effect transistor (FET): the FET is destroyed by an excessive current or excessive voltage generated when a current is turned on or off.SOLUTION: The value of a gate resistor is so controlled that the following is implemented: when a current is turned on, the value of the gate resistor 110 is a value large sufficient to prevent a gate voltage from producing a parasitic oscillation by a gate stray capacitance and a gate tray inductance when a gate voltage rises and is small sufficient to exclude the possibility that FET operates in an active region within a gate voltage rise time and this leads to destruction, and when a current is turned off, the gate resistance value is large sufficient for eliminating the possibility that gate voltage rapidly drops and a source-drain voltage produces overshoot due to a counter electromotive force.
申请公布号 JP2011199970(A) 申请公布日期 2011.10.06
申请号 JP20100062071 申请日期 2010.03.18
申请人 YOSHIDA YUHO 发明人 YOSHIDA YUHO
分类号 H02M1/08 主分类号 H02M1/08
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