发明名称 |
FILM FORMATION METHOD, AND PLASMA FILM FORMATION APPARATUS |
摘要 |
Disclosed is a film formation method which can form a thin film on an object that has, formed on the surface thereof, an insulating layer having a depressed portion. The method is characterized by comprising the following steps: a thin film formation step of forming a thin titanium nitride film on the surface of the object including the surface in the depressed portion by a plasma CVD technique; and a nitriding step of subjecting the thin film to a nitriding process using plasma in the presence of a nitrogen gas to nitride the thin film. |
申请公布号 |
KR20110110261(A) |
申请公布日期 |
2011.10.06 |
申请号 |
KR20117017698 |
申请日期 |
2010.01.27 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
YAMASAKI HIDEAKI;KOAKUTSU MASATO |
分类号 |
H01L21/285;C23C16/34;H01L21/3205 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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