发明名称 FILM FORMATION METHOD, AND PLASMA FILM FORMATION APPARATUS
摘要 Disclosed is a film formation method which can form a thin film on an object that has, formed on the surface thereof, an insulating layer having a depressed portion.  The method is characterized by comprising the following steps: a thin film formation step of forming a thin titanium nitride film on the surface of the object including the surface in the depressed portion by a plasma CVD technique; and a nitriding step of subjecting the thin film to a nitriding process using plasma in the presence of a nitrogen gas to nitride the thin film.
申请公布号 KR20110110261(A) 申请公布日期 2011.10.06
申请号 KR20117017698 申请日期 2010.01.27
申请人 TOKYO ELECTRON LIMITED 发明人 YAMASAKI HIDEAKI;KOAKUTSU MASATO
分类号 H01L21/285;C23C16/34;H01L21/3205 主分类号 H01L21/285
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