发明名称 SURFACE INSPECTION APPARATUS AND METHOD
摘要 A surface inspection apparatus includes a light source for applying a detection laser beam to a film sample. A light receiver has plural photomultiplier tubes arranged in a width direction of the film sample, for receiving output light reflected by the film sample. A defect detector detects a defect on the film sample according to an output signal output by each of the photomultiplier tubes. A sensitivity corrector sets sensitivity of the photomultiplier tubes to process an output of the light receiver for output noise suppression. Specifically, the sensitivity corrector determines a set sensitivity of the photomultiplier tubes by correcting a sensitivity characteristic thereof for abnormality detection, to keep a sensitivity difference between the photomultiplier tubes as small as a predetermined value or less. Furthermore, plural light valves upstream from the light receivers are controlled by the sensitivity corrector for their transmittance.
申请公布号 US2011242537(A1) 申请公布日期 2011.10.06
申请号 US201113070565 申请日期 2011.03.24
申请人 FUJIFILM CORPORATION 发明人 SHIGETA BUNGO;TAKAHASHI IPPEI
分类号 G01N21/89 主分类号 G01N21/89
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