发明名称 COMPOSITION AND METHOD FOR REDUCING PATTERN COLLAPSE
摘要 A radiation-sensitive composition and method for using the composition to reduce the probability of pattern collapse is provided. The radiation-sensitive composition includes a bulk matrix of radiation-sensitive material with a base-reactive, surface-modifying agent dispersed throughout the matrix. The base-reactive, surface-modifying agent is reactive to hydroxide and increases the surface hydrophobicity of a pattern formed in a layer of the radiation-sensitive composition upon treatment with a basic developing solution during lithographic processing of a substrate.
申请公布号 US2011244391(A1) 申请公布日期 2011.10.06
申请号 US20100751393 申请日期 2010.03.31
申请人 TOKYO ELECTRON LIMITED 发明人 SOMERVELL MARK H.
分类号 G03F7/004;G03F7/20 主分类号 G03F7/004
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