发明名称 Test Plate for Electronic Component Handler
摘要 Test plates with improved test pockets are described herein. One embodiment is a circular test plate comprising a plurality of test pockets, each test pocket being a quadrilateral hole in the test plate, and each quadrilateral hole having four sides and four corners located at the intersections of the sides. Each of the four corners comprises at least one corner having a corner relief that extends from and intersects each of the at least one corner's two intersecting sides, and any remaining corners not having a corner relief. The test plate can be incorporated into a component handler.
申请公布号 US2011241718(A1) 申请公布日期 2011.10.06
申请号 US201113163563 申请日期 2011.06.17
申请人 ELECTRO SCIENTIFIC INDUSTRIES, INC. 发明人 BOE GERALD F.
分类号 G01R31/00 主分类号 G01R31/00
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