发明名称 MEMORY SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a memory system having longer life or higher reliability of the whole system as compared with conventional practice by taking account of a variance in consistency of write and erase frequency between lot, individual, chip, block, etc.SOLUTION: The memory system includes: a nonvolatile semiconductor memory 10 having a plurality of normal blocks 1-n which are units of data erase, and a dummy block D; a write control part 13 for rewriting not less than maximum rewriting frequency of the plurality of normal blocks 1-n to the dummy block D; a monitor part 11 for monitoring a data erase period or write period of the dummy block D; and a wear leveling control part 12 for averaging the rewriting frequency between the normal blocks 1-n, wherein decision is made whether the rewriting of the normal blocks 1-n can be continued or not, based on the monitoring result of the monitor part 11.
申请公布号 JP2011198433(A) 申请公布日期 2011.10.06
申请号 JP20100066768 申请日期 2010.03.23
申请人 TOSHIBA CORP 发明人 ABE TAKAYUKI
分类号 G11C16/02;G06F12/16;G11C16/04 主分类号 G11C16/02
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