发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that has a plurality of capacitors with different characteristics without exposing a surface of a ferroelectric film to a resist.SOLUTION: The method of manufacturing the semiconductor device includes the processes of: forming an insulating film over a substrate; forming a lower electrode layer over the insulating film; forming the ferroelectric film on the lower electrode layer; forming a first upper electrode layer on the ferroelectric film; forming a first resist covering a first region on the first upper electrode layer; removing the first upper electrode layer in a second region by etching using the first resist as a mask and also shaving the ferroelectric film in the second region; forming a second upper electrode layer on the first upper electrode layer in the first region and on the ferroelectric film not in the first region; forming a second resist in the first region and the second region; and forming a first capacitor and a second capacitor by etching the first upper electrode layer, the second upper electrode layer, the ferroelectric film, and the lower electrode layer through the second resist as a mask. |
申请公布号 |
JP2011199071(A) |
申请公布日期 |
2011.10.06 |
申请号 |
JP20100065211 |
申请日期 |
2010.03.19 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
O FUMIO |
分类号 |
H01L27/105;H01L21/822;H01L21/8246;H01L27/04 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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