摘要 |
<p>The method for producing an optoelectronic device including a layer, comprises providing a substrate (201) into a coating chamber (200), supplying a gas into the coating chamber, generating a plasma in the gas by supply energy via to electrodes (202), depositing a material for the layer on the substrate, and finishing the optoelectronic device. The layer is deposited in a chamber using plasma enhanced deposition process, in an optically active area (206) of the optoelectronic device and on the substrate with the deposition rate of = 350Å /minute. The method for producing an optoelectronic device including a layer, comprises providing a substrate (201) into a coating chamber (200), supplying a gas into the coating chamber, generating a plasma in the gas by supply energy via to electrodes (202), depositing a material for the layer on the substrate, and finishing the optoelectronic device. The layer is deposited in a chamber using plasma enhanced deposition process, in an optically active area (206) of the optoelectronic device and on the substrate with the deposition rate of = 350Å /minute, and deposited as an intrinsic layer and a boundary that is formed to a doped layer through the layer by an optoelectronic device and as an intrinsic microcrystalline silicon layer. The plasma is generated at a power density of = 0.4 w/cm 2>. The coating chamber has a deposition surface (208) of >= 1 m 2>. The substrate is placed between two electrodes so that the deposition surface is faced on one of the electrodes at a distance (= 10 mm) from the electrodes. The material for the intrinsic layer in a region removed from the boundary with other processing conditions is deposited as the material for a layer in the boundary region.</p> |