发明名称 Manufacturing method of semiconductor device including peeling step
摘要 To simplify a peeling step in a method for manufacturing a semiconductor device including the peeling step. A first layer having a metal film is formed over a substrate; a second layer having a transistor is formed over the first layer having the metal film; a resin material is applied over the layer having the transistor; the resin material is cured by a heat treatment at a first heat treatment temperature to form a resin layer; the layer having the transistor is peeled from the substrate by a heat treatment at a second heat treatment temperature which is higher than the first heat treatment temperature; and the resin layer is peeled from the layer having the transistor by a heat treatment at a third heat treatment temperature which is higher than the second heat treatment temperature.
申请公布号 US8030132(B2) 申请公布日期 2011.10.04
申请号 US20060442216 申请日期 2006.05.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OGITA KAORI;TAMURA TOMOKO
分类号 H01L21/027;H01L31/0392 主分类号 H01L21/027
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