发明名称 |
System for testing an integrated circuit of a device and its method of use |
摘要 |
A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.
|
申请公布号 |
US8030957(B2) |
申请公布日期 |
2011.10.04 |
申请号 |
US20090411233 |
申请日期 |
2009.03.25 |
申请人 |
AEHR TEST SYSTEMS |
发明人 |
LINDSEY SCOTT E.;YEH JUNYJE;JOVANOVIC JOVAN;MALATHONG SEANG P. |
分类号 |
G01R1/067;G01R31/20 |
主分类号 |
G01R1/067 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|