发明名称 System for providing a reference voltage to a semiconductor integrated circuit
摘要 A system for providing a reference voltage includes a tester adapted to provide a predetermined current, a first ground pad connected to a ground voltage of the tester, a second ground pad connected between the tester and the first ground pad, the second ground pad being connected to the tester through first and second resistors, a reference voltage pad connected to a node between the first and second resistors, the reference voltage pad adapted to provide a test reference voltage, and a multiplexer connected to the reference voltage pad, the multiplexer configured to output the test reference voltage as a reference voltage during substantial voltage variation.
申请公布号 US8030958(B2) 申请公布日期 2011.10.04
申请号 US20070878498 申请日期 2007.07.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NOH YONG-HWAN
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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