发明名称 Method of on-chip current measurement and semiconductor IC
摘要 A semiconductor integrated circuit that includes a circuit block having a predetermined function, a power switch capable of supplying an operating power to the circuit block, and a current measuring circuit for obtaining a current flowing to the circuit block based on a voltage between terminals of the power switch in a state in which the power switch is turned on and an on-resistance of the power switch. Thus, it is possible to measure a current of the circuit block in a state in which a chip is normally operated.
申请公布号 US8030956(B2) 申请公布日期 2011.10.04
申请号 US20100878564 申请日期 2010.09.09
申请人 RENESAS ELECTRONICS CORPORATION 发明人 OTSUGA KAZUO;YAMADA TETSUYA;OSADA KENICHI;KANNO YUSUKE
分类号 G01R31/3187;G01R31/28 主分类号 G01R31/3187
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