Method for detecting fault-injection error attack within electronic microcircuit of smart card, involves activating detection signals when voltages at mass and supply terminals exceed threshold voltages

摘要

The method involves forming a microcircuit (IC) in a substrate (SUB), and forming a first set of housings (PW1, PW2) in the substrate, where the first set of housings is electrically insulated from the substrate by a second set of housings (NW1, NW2) and a third set of housings (NISO1, NISO2). Data processing circuits (ISC1, ISC2) are formed in the first and second set of housings, where the circuits include a mass terminal (LG1) and supply terminals. Detection signals (DS1, DS2, DS3) are activated when voltages (Vgb1, Vdd) at the terminals exceed threshold voltages. Independent claims are also included for the following: (1) an electronic microcircuit comprising a data processing circuit associated with a detection circuit (2) a portable device comprising an electronic microcircuit.