发明名称 |
INTEGRATED CIRCUIT DEVICE AND INSPECTION METHOD OF INTEGRATED CIRCUIT DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To shorten a time for reading a value of a resistor in an integrated circuit device in inspection of the integrated circuit device. <P>SOLUTION: The integrated circuit device includes an operation-mode setting terminal and a first register including a read flag. The read flag is a flag for allowing reading of a value stored in the first register. When the device is set in a first operation mode by the operation-mode setting terminal and the read flag is set to allow the read, the value stored in the first register is output exterior corresponding to a read demand signal from exterior. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011191093(A) |
申请公布日期 |
2011.09.29 |
申请号 |
JP20100055456 |
申请日期 |
2010.03.12 |
申请人 |
SEIKO EPSON CORP |
发明人 |
CHOKAI YUICHI;KOBAYASHI HIRONORI;MURAYAMA YOSHIHIRO |
分类号 |
G01R31/28;G06F11/22;H01L21/822;H01L27/04 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|