发明名称 INTEGRATED CIRCUIT DEVICE AND INSPECTION METHOD OF INTEGRATED CIRCUIT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To shorten a time for reading a value of a resistor in an integrated circuit device in inspection of the integrated circuit device. <P>SOLUTION: The integrated circuit device includes an operation-mode setting terminal and a first register including a read flag. The read flag is a flag for allowing reading of a value stored in the first register. When the device is set in a first operation mode by the operation-mode setting terminal and the read flag is set to allow the read, the value stored in the first register is output exterior corresponding to a read demand signal from exterior. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011191093(A) 申请公布日期 2011.09.29
申请号 JP20100055456 申请日期 2010.03.12
申请人 SEIKO EPSON CORP 发明人 CHOKAI YUICHI;KOBAYASHI HIRONORI;MURAYAMA YOSHIHIRO
分类号 G01R31/28;G06F11/22;H01L21/822;H01L27/04 主分类号 G01R31/28
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