发明名称 SEMICONDUCTOR WAFER AND SEMICONDUCTOR WAFER FOR HIGH FREQUENCY ELECTRONIC DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer which has a nitride semiconductor film formed on a supporting substrate such as a silicon substrate with an epitaxial layer formed on the nitride semiconductor film. <P>SOLUTION: The semiconductor wafer includes a supporting substrate, a nitride semiconductor thin film provided on a surface of the supporting substrate, and a nitride semiconductor epitaxial layer formed through vapor-phase growth on the nitride semiconductor thin film. In this semiconductor wafer, the nitride semiconductor thin film is a GaN thin film produced by peeling off from a GaN substrate with an ion-implanted layer provided in the GaN substrate as a boundary, wherein the GaN thin film has a (000-1) nitrogen surface side on the supporting substrate side and a (0001) Ga surface side as a vapor-phase growth face of the nitride semiconductor epitaxial layer. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011193010(A) 申请公布日期 2011.09.29
申请号 JP20110100426 申请日期 2011.04.28
申请人 HITACHI CABLE LTD 发明人 TANAKA TAKESHI
分类号 H01L21/20;H01L21/02;H01L21/338;H01L29/778;H01L29/812;H01L33/32 主分类号 H01L21/20
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