发明名称 EVALUATION ELEMENT
摘要 PROBLEM TO BE SOLVED: To enhance sensitivity in detecting charged-up charges. SOLUTION: An evaluation element includes an insulating film 14, formed on a semiconductor substrate 10; first wiring lines 20 formed within the insulating film and having an extension 22 extended in an extension direction; contacts 26 provided within the insulating film to electrically connect the semiconductor substrate and the extension; second wiring lines 30, having a counter part 32 formed within the insulating film to be opposite to a face direction of the semiconductor substrate and to be smaller in length than the extension and also having a lead part 34, extending from the counter part to a direction facing the first wiring lines; and an antenna electrode 40 electrically connected to the lead part. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011192915(A) 申请公布日期 2011.09.29
申请号 JP20100059537 申请日期 2010.03.16
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 SATAKE NOBUO
分类号 H01L21/66;H01L21/3205;H01L21/822;H01L23/52;H01L27/04 主分类号 H01L21/66
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