| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an instrument and a method for measuring a terahertz wave, capable of quantitatively improving the properties of acquired frequency spectrum data. <P>SOLUTION: In the measuring method using the terahertz wave measuring instrument, time waveform 309 of terahertz wave is measured with respect to a calibration sample known in a shape of a calibrating spectrum 311 by the terahertz wave measuring instrument, so that a time waveform is converted to acquire a measuring spectrum 310. The calibration spectrum 311 is compared with the measuring spectrum 310, and the time interval 315 of the measured data constituting a time waveform 313 is adjusted, on the basis of the comparison result to perform the calibration of the terahertz wave measuring instrument. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
