发明名称 VOLTAGE ABNORMALITY DETECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a voltage abnormality detection circuit having a miniaturized constitution. SOLUTION: This circuit includes: a reference voltage generation circuit 1 for generating a reference voltage by being fed from a first power source V1; a voltage dividing circuit 2 for dividing a supply voltage of the first power source V1; a diode D1 inserted between a second power source V2 and the voltage dividing circuit 2; a diode D2 inserted between the second power source V2 and the reference voltage generation circuit 1; and a comparator 3 for comparing a divided voltage acquired by the voltage dividing circuit 2 with the reference voltage generated from the reference voltage generation circuit 1, and detecting an abnormality of each supply voltage of the first power source V1 and the second power source V2 based on the comparison result. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011191235(A) 申请公布日期 2011.09.29
申请号 JP20100058937 申请日期 2010.03.16
申请人 HITACHI AUTOMOTIVE SYSTEMS LTD 发明人 TAKEI OSAMU
分类号 G01R19/165 主分类号 G01R19/165
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