发明名称 SIMULATION METHOD, SIMULATION DEVICE, PROGRAM AND STORAGE MEDIUM
摘要 <p><P>PROBLEM TO BE SOLVED: To specify a boundary between a non-defective status and a defective status of a product in design space, and specify the most-probable point closest to the origin inside the boundary or an optimum design point. <P>SOLUTION: In a simulation method for simulating an operation of a device or a circuit, a computer specifies a boundary between a non-defective status and a defective status of a product in design space with a design parameter as an origin, according to a search using a search indicator defined based on an operating state different from an operating state of a determination indicator that determines the non-defective status and the defective status of the operation. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011192156(A) 申请公布日期 2011.09.29
申请号 JP20100059337 申请日期 2010.03.16
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 IKEDA HIROSHI;MATSUOKA HIDETOSHI
分类号 G06F17/50 主分类号 G06F17/50
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