发明名称 METHOD AND APPARATUS MANAGING WORN CELLS IN RESISTIVE MEMORIES
摘要 A method and apparatus for management worn resistive memory cells are presented. A normal read mode or worn memory cell detecting mode are used depending on the wear state of a resistive memory cell. A detection reference point is changed upon wear indication to detect the resistance of the resistive memory cell. The resistance of the resistive memory cell is detected using the changed detection reference point to determine whether or not the resistive memory cell is worn by comparing the detected resistance to a wear reference level.
申请公布号 US2011235403(A1) 申请公布日期 2011.09.29
申请号 US201113053337 申请日期 2011.03.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG YONG-HOON
分类号 G11C29/04 主分类号 G11C29/04
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