发明名称 BACKSIDE DUMMY PLUGS FOR 3D INTEGRATION
摘要 A semiconductor structure includes backside dummy plugs embedded in a substrate. The backside dummy plugs can be a conductive structure that enhances vertical thermal conductivity of the semiconductor structure and provides electrical decoupling of signals in through-substrate vias (TSVs) in the substrate. The backside dummy plug can include a cavity to accommodate volume changes in other components in the substrate, thereby alleviating mechanical stress in the substrate during thermal cycling and operation of the semiconductor chip. The backside dummy plug including the cavity can be composed of an insulator material or a conductive material. The inventive structures can be employed to form three-dimensional structures having vertical chip integration, in which inter-wafer thermal conductivity is enhanced, cross-talk between signals through TSVs is reduced, and/or mechanical stress to the TSVs is reduced.
申请公布号 WO2011119192(A1) 申请公布日期 2011.09.29
申请号 WO2010US59085 申请日期 2010.12.06
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;KOESTER, STEVEN, J.;LIU, FEI 发明人 KOESTER, STEVEN, J.;LIU, FEI
分类号 H01L21/00;H01L21/98;H01L23/48 主分类号 H01L21/00
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