发明名称 Method for integrating low-k dielectrics
摘要 A method for treating a dielectric film on a substrate and, in particular, a method for integrating a low-k dielectric film with subsequently formed metal interconnects is described. The method includes preparing a dielectric film on a substrate, wherein the dielectric film is a low-k dielectric film having a dielectric constant less than or equal to a value of about 4. Thereafter, the method further includes performing a preliminary curing process on the dielectric film, forming a pattern in the dielectric film using a lithographic process and an etching process, removing undesired residues from the substrate, and performing a final curing process on the dielectric film, wherein the final curing process includes irradiating the substrate with ultraviolet (UV) radiation.
申请公布号 US2011237080(A1) 申请公布日期 2011.09.29
申请号 US201113072662 申请日期 2011.03.25
申请人 TOKYO ELECTRON LIMITED 发明人 LIU JUNJUN;TOMA DOREL I.;YUE HONGYU
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
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