| 摘要 |
A radio frequency identification (RFID) device performs a test on tag chips using a parallel test mode to reduce a test time and improve a test speed. The RFID device includes a plurality of tag chips each configured to perform a test in response to an externally applied test input signal and output a test output signal corresponding to a test result, and a test chip configured to perform a parallel test on the plurality of tag chips simultaneously in response to data, an address and a control signal applied from the outside through a pad in a test mode.
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