发明名称 Scan/Scan Enable D Flip-Flop
摘要 In accordance with an embodiment, an integrated circuit comprises a master-slave flip-flop, a selection logic circuit, and a pass structure. The selection logic circuit is configured to selectively enable or disable one or more clock signals. The pass structure is configured to pass a data signal to the master-slave flip-flop in response to a selected clock signal being enabled.
申请公布号 US2011234283(A1) 申请公布日期 2011.09.29
申请号 US20100771157 申请日期 2010.04.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WU MIAOSONG
分类号 H03K3/289;G06F1/04 主分类号 H03K3/289
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