发明名称 Scanning probe microscope with independent force control and displacement measurements
摘要 A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the interferometer determining a distance between a reference location and the moveable reflector. The rod is characterized by a rod axis and includes a tip on a first end thereof, the rod includes the moveable reflector at a location proximate to the tip. The tip is disposed in a manner that allows the tip to be forced against the surface of a sample. The force actuator applies a force to the rod in a direction parallel to the rod axis in response to a force control signal coupled to the actuator. The controller receives the determined distance from the interferometer and generates the force control signal. The invention can also be used as a scanning probe microscope.
申请公布号 US8028343(B2) 申请公布日期 2011.09.27
申请号 US20090362359 申请日期 2009.01.29
申请人 NANONMECHANICS, INC. 发明人 OLIVER WARREN C.;SWINDERNAN JOHN;HAY JENNIFER;PARKS KARMIT
分类号 G01Q20/02;G01Q10/00;G01Q90/00 主分类号 G01Q20/02
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