| 摘要 |
The invention relates to measuring technique and can be used for tests, metrological attestation, verification or calibration of electromagnetic, resonance and other level measuring devices. The method for determination of metrological characteristics of measuring channel of electromagnetic level measuring device with primary transformer as an elongated two-wire strip type transmission line provides introduction of non-homogeneity of wave resistance to transmission line with closing conductors of two-wire transmission line with electro-conductive link directed normally to conductors, position of that one is determined by the end measure of length installed in parallel to two-wire transmission line and determination of readings of measuring device of level measuring device. The testbench for determination of metrological characteristics of measuring channel of electromagnetic level measuring device includes means for setting distance as at least one end measure of length installed in parallel to waveguide of the primary transformer as a two-wire strip type transmission line and means for fixation of distance and formation of reflected measuring signal as electro-conductive link, this can be in contact with conductors of waveguide and has means for fixation with respect to the end length measure. Contact device of the testbench has an electro-conductive link that is fixed on the beam that is hinged on a platform that has means for fixation with respect to the end length measures. |”Use of the method claimed, the testbench and contact device provides high accuracy of measurement and calibration, simplicity of the method and decrease of labor consumption of implementation of works. |
