发明名称 LITHOGRAPHY APPARATUS AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To solve such a problem in a prior art that, after each scanning operation, the direction of mask scanning operation and the direction of substrate scanning operation are reversed and a substrate is moved even across the scanning direction, thus consuming a time. <P>SOLUTION: A lithography apparatus includes an illumination system. The illumination system is arranged to provide a first radiation beam forming a first mask illumination zone and at the same time, and to provide a second radiation beam forming a second mask illumination zone. The first and second mask illumination zones are arranged to illuminate the same mask at the same time. The lithography apparatus also includes a light projection system. The projection system projects the first radiation beam so as to form a first substrate illumination zone and at the same time, and projects the second radiation beam so as to form a second substrate illumination zone. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011187930(A) 申请公布日期 2011.09.22
申请号 JP20100278879 申请日期 2010.12.15
申请人 ASML NETHERLANDS BV 发明人 BASELMANS JOHANNES JACOBUS MATHEUS;FAHRNI FRANCIS;JOSEPH KEIJSERS GERARDUS J;MULDER HEINE MELLE;PONGERS WILLEM RICHARD;HAGEMAN JOOST CYRILLUS LAMBERT;VAN BRUGGEN MATTHEUS JOHANNES;ROOSEKRANS JOHANNES FRANCISCUS;BUTLER DAVID JAMES;THOMASSEN PATRICK MARCEL MARIA;PAEVA GABRIELA VESSELINOVA
分类号 H01L21/027 主分类号 H01L21/027
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