发明名称 Flexible Processing Method for Metal-Insulator-Metal Capacitor Formation
摘要 A method for forming a metal-insulator-metal (MIM) capacitor includes forming a capacitor bottom plate and a metal interconnect feature on a substrate. A dielectric layer having a predetermined thickness is then formed. The dielectric layer has a first portion overlying the capacitor bottom plate and a second portion overlying the metal interconnect feature. The dielectric layer is processed to adjust the thickness of the first portion of the dielectric layer relative the thickness of the second portion of the dielectric layer. Processing can include etching the first portion of the dielectric layer or adding dielectric material to the second portion of the dielectric layer. A capacitor top plate is formed over the first portion of the dielectric layer to complete the MIM structure.
申请公布号 US2011227195(A1) 申请公布日期 2011.09.22
申请号 US201113115310 申请日期 2011.05.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HORNG SHEAN-REN;HOU KUO-NAN;LAI FENG-LIANG
分类号 H01L29/02 主分类号 H01L29/02
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