发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 A manufacturing method of a semiconductor device includes the steps of carrying a substrate in a processing chamber, bringing the processing chamber into a state at a first pressure by supplying a silicon compound gas which contains carbon and hydrogen into the processing chamber, forming a silicon oxide film on the substrate by irradiating a UV light to the silicon compound gas supplied into the processing chamber in the state kept at the first pressure, and decompression process to bring the processing chamber into a state at a second pressure lower than the first pressure. This makes it possible to form the dense silicon oxide film in the trench with high aspect ratio and small width.
申请公布号 US2011230061(A1) 申请公布日期 2011.09.22
申请号 US201113151229 申请日期 2011.06.01
申请人 HITACHI KOSKUSAI ELECTRIC INC. 发明人 OHASHI NAOFUMI;WADA YUICHI;OWADA NOBUO;TANIGUCHI TAKESHI
分类号 H01L21/316 主分类号 H01L21/316
代理机构 代理人
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