| 摘要 |
Techniques are described for sum address compare (A+B=K) operation for use in translation lookaside buffers and content addressable memory devices, for example. Address input signals A and B are supplied as input to the A+B=K operation and K is a previous value stored in a plurality of memory cells. In each memory cell, a single logic gate circuit output and its inversion are generated in response to updating the memory cells, wherein each single logic gate circuit has as input an associated memory cell output and a next lowest significant bit adjacent memory cell output. In each of the memory cells, a portion of the A+B=K operation associated with each memory cell is generated in a partial lookup compare circuit wherein the corresponding address input signals A and B are combined with the associated memory cell output and the generated single logic gate circuit output and its inversion during a read lookup compare operation. |
